论文信息 - Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor.

Nonlinear ellipse rotation modified Z-scan measurements of third-order nonlinear susceptibility tensor.

We present a method that combines the Z-scan technique with nonlinear ellipse rotation (NER) to measure third-order nonlinear susceptibility components. The experimental details are demonstrated, and a comprehensive theoretical analysis is given. The validity of this method is verified by the measurements of the nonlinear susceptibility tensor of a well-characterized liquid, CS2.

[1] S. Friberg,et al. Nonlinear optical glasses for ultrafast optical switches , 1987 .

[2] Mansoor Sheik-Bahae,et al. Eclipsing Z-scan measurement of λ/10 4 wave-front distortion , 1994 .

[3] Mansoor Sheik-Bahae,et al. THIRD ORDER OPTICAL NONLINEARITIES , 2000 .

[4] Georges Boudebs,et al. Third-order susceptibility measurements by nonlinear image processing , 1996 .

[5] R. W. Terhune,et al. Intensity-Dependent Changes in the Refractive Index of Liquids , 1964 .

[6] E. W. Stryland,et al. Sensitive Measurement of Optical Nonlinearities Using a Single Beam Special 30th Anniversary Feature , 1990 .

[7] R. W. Terhune,et al. Study of Optical Effects Due to an Induced Polarization Third Order in the Electric Field Strength , 1965 .

[8] Peter Palffy-Muhoray,et al. Z-scan technique using top-hat beams , 1993, OSA Annual Meeting.