Iterative control approach to high-speed force-distance curve measurement using AFM: time-dependent response of PDMS example.

Force-distance curve measurements using atomic force microscope (AFM) has been widely used in a broad range of areas. However, currently force-curve measurements are hampered the its low speed of AFM. In this article, a novel inversion-based iterative control technique is proposed to dramatically increase the speed of force-curve measurements. Experimental results are presented to show that by using the proposed control technique, the speed of force-curve measurements can be increased by over 80 times--with no loss of spatial resolution--on a commercial AFM platform and with a standard cantilever. High-speed force curve measurements using this control technique are utilized to quantitatively study the time-dependent elastic modulus of poly(dimethylsiloxane) (PDMS). The force-curves employ a broad spectrum of push-in (load) rates, spanning two-order differences. The elastic modulus measured at low-speed compares well with the value obtained from dynamic mechanical analysis (DMA) test, and the value of the elastic modulus increases as the push-in rate increases, signifying that a faster external deformation rate transitions the viscoelastic response of PDMS from that of a rubbery material toward a glassy one.

[1]  Qingze Zou,et al.  Design and Control of Optimal Scan Trajectories: Scanning Tunneling Microscope Example , 2004 .

[2]  W F Heinz,et al.  Relative microelastic mapping of living cells by atomic force microscopy. , 1998, Biophysical journal.

[3]  M A Horton,et al.  New technologies in scanning probe microscopy for studying molecular interactions in cells , 2000, Expert Reviews in Molecular Medicine.

[4]  Sandor Kasas,et al.  Deformation and height anomaly of soft surfaces studied with an AFM , 1993 .

[5]  J. Zlatanova,et al.  Single molecule force spectroscopy in biology using the atomic force microscope. , 2000, Progress in biophysics and molecular biology.

[6]  Andreas Ebner,et al.  Simultaneous topography and recognition imaging using force microscopy. , 2004, Biophysical journal.

[7]  Pranav Shrotriya,et al.  Onset of nanoscale wear of metallic implant materials: Influence of surface residual stresses and contact loads , 2007 .

[8]  Christoph Bräuchle,et al.  Stretching siloxanes: An ab initio molecular dynamics study , 2005 .

[9]  Paul K. Hansma,et al.  Imaging adhesion forces and elasticity of lysozyme adsorbed on mica with the atomic force microscope , 1994 .

[10]  R. Colton,et al.  Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope , 1989 .

[11]  Georg Schitter,et al.  Identification and open-loop tracking control of a piezoelectric tube scanner for high-speed scanning-probe microscopy , 2004, IEEE Transactions on Control Systems Technology.

[12]  L.Y. Pao,et al.  A Tutorial on the Mechanisms, Dynamics, and Control of Atomic Force Microscopes , 2007, 2007 American Control Conference.

[13]  Jan Greve,et al.  Adhesion force imaging in air and liquid by adhesion mode atomic force microscopy , 1994 .

[14]  Qingze Zou,et al.  Preview-based optimal inversion for output tracking: application to scanning tunneling microscopy , 2004, IEEE Transactions on Control Systems Technology.

[15]  C. Quate,et al.  Forces in atomic force microscopy in air and water , 1989 .

[16]  M. Huggins Viscoelastic Properties of Polymers. , 1961 .

[17]  H. Güntherodt,et al.  Unbinding forces of single antibody-antigen complexes correlate with their thermal dissociation rates. , 2000, Proceedings of the National Academy of Sciences of the United States of America.

[18]  Qingze Zou,et al.  A New Approach to Scan-Trajectory Design and Track : AFM Force Measurement Example , 2008 .

[19]  Qingze Zou,et al.  Robust-inversion-based 2DOF-control design for output tracking: Piezoelectric actuator example , 2007, 2007 46th IEEE Conference on Decision and Control.

[20]  G. Pharr,et al.  An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments , 1992 .

[21]  G. Palmese,et al.  Nanoscale Indentation of Polymer Systems Using the Atomic Force Microscope , 1997 .

[22]  Butt,et al.  Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope. , 1992, Physical review. B, Condensed matter.

[23]  V. V. Gorbunov,et al.  Surface force spectroscopy of elastomeric nanoscale films , 2001 .

[24]  F. Allgower,et al.  Robust 2 DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy , 2003, Proceedings of the 2003 American Control Conference, 2003..

[25]  N Almqvist,et al.  Elasticity and adhesion force mapping reveals real-time clustering of growth factor receptors and associated changes in local cellular rheological properties. , 2004, Biophysical journal.

[26]  Zhiqun Lin,et al.  Materials science: Molecules squeezed and stroked , 2003, Nature.

[27]  S. O. Reza Moheimani,et al.  Sensor-less Vibration Suppression and Scan Compensation for Piezoelectric Tube Nanopositioners , 2005, CDC 2005.

[28]  J. Bechhoefer,et al.  Calibration of atomic‐force microscope tips , 1993 .

[29]  J A Greenwood,et al.  Oscillating adhesive contacts between micron-scale tips and compliant polymers. , 2006, Journal of colloid and interface science.

[30]  Kathryn J. Wahl,et al.  Quantitative imaging of nanoscale mechanical properties using hybrid nanoindentation and force modulation , 2001 .

[31]  Shuo-Hung Chang,et al.  Viscoelastic characterization of polymers using instrumented indentation. I. Quasi-static testing , 2005 .

[32]  Kathryn J. Wahl,et al.  Nanoindentation and contact stiffness measurement using force modulation with a capacitive load-displacement transducer. , 1999 .

[33]  D. Croft,et al.  Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application , 2001 .

[34]  G. Charras,et al.  Determination of cellular strains by combined atomic force microscopy and finite element modeling. , 2002, Biophysical journal.

[35]  Mi-Ching Tsai Special issue on advances in nano-technology control , 2004 .

[36]  S. Granick,et al.  Viscoelastic Dynamics of Confined Polymer Melts , 1992, Science.

[37]  Xiaodong Li,et al.  The effect of protein adsorption on the friction behavior of ultra-high molecular weight polyethylene , 2006 .

[38]  Qingze Zou,et al.  Iterative Control Approach to Compensate for Both the Hysteresis and the Dynamics Effects of Piezo Actuators , 2007, IEEE Transactions on Control Systems Technology.

[39]  H Schindler,et al.  Simultaneous height and adhesion imaging of antibody-antigen interactions by atomic force microscopy. , 1998, Biophysical journal.

[40]  Qingze Zou,et al.  Iterative control of dynamics-coupling-caused errors in piezoscanners during high-speed AFM operation , 2005, IEEE Transactions on Control Systems Technology.

[41]  H. Butt,et al.  Force measurements with the atomic force microscope: Technique, interpretation and applications , 2005 .

[42]  S Devasia,et al.  CONTROL ISSUES IN HIGH‐SPEED AFM FOR BIOLOGICAL APPLICATIONS: COLLAGEN IMAGING EXAMPLE , 2004, Asian journal of control.

[43]  Minh Q. Phan,et al.  Identification and Control of Mechanical Systems: System Identification , 2001 .

[44]  Murti V. Salapaka,et al.  High bandwidth nano-positioner: A robust control approach , 2002 .

[45]  C. White,et al.  Viscoelastic Characterization of Polymers Using Dynamic Instrumented Indentation , 2004 .