Simulation and modeling for soft recovery of p-i-n rectifiers

Soft recovery of fast-switching p-i-n rectifiers is studied using experimental data and a novel coupled device and circuit simulator. An analytical model for determining lifetimes is presented and verified by numerical simulations. The softness factor is difficult to model analytically; hence simulations are necessary. Coupled device and circuit simulations also allow a determination of the magnitude of the inductive voltage spike that appears across the rectifier during an unclamped reverse recovery.<<ETX>>