Raman spectroscopy as a tool for characterization of strained hexagonal GaN/AlxGa1-xN superlattices
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A. N. Smirnov | I. N. Goncharuk | S. Karpov | V. Davydov | H. Harima | M. Smirnov | M. Baidakova | W. Lundin | E. Zavarin | M. Scheglov | R. Kyutt