Extraction of Subgap Density of States in Amorphous InGaZnO Thin-Film Transistors by Using Multifrequency Capacitance–Voltage Characteristics
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Dong Myong Kim | Sungwook Park | Dae Hwan Kim | Chang Jung Kim | Ihun Song | Jun-Hyun Park | C. J. Kim | Young-soo Park | Y. Jeon | Sungwook Park | D. M. Kim | D. Kim | I. Song | Jae-Chul Park | Youngsoo Park | Kichan Jeon | Jaechul Park | Sungchul Kim | Sangwon Lee | Sangwon Lee | Jun‐Hyun Park | K. Jeon | Sungchul Kim | Yongwoo Jeon
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