An integrated 16-channel CMOS time to digital converter
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An integrated 16-channel Time to Digital Converter (TDC) for use in the NA48 experiment at CERN has been developed in a 1 /spl mu/m CMOS technology. The resolution is 156ns and the total time history is 204.8 ms. Buffering of up to 128 hits is done in on-chip FIFOs. The chip area is 25 mm/sup 2/. The vernier circuit consists of a 16-tap voltage-controlled delay chain controlled by a Delay Locked Loop (DLL). Read out is possible at 40 MHz. JTAG/IEEE 1149.1 protocol has been incorporated to allow in-site testing of the chip. The JTAG data path is also used to access internal control and status registers. >
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