Electromigration: A review

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[76]  S. Vaidya,et al.  Electromigration Induced Leakage at Shallow Junction Contacts Metallized with Aluminum/Poly-Silicon , 1982, 20th International Reliability Physics Symposium.

[77]  Kiyoshi Nikawa,et al.  Monte Carlo Calculations Based on the Generalized Electromigration Failure Model , 1981, 19th International Reliability Physics Symposium.

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