论文信息 - Growth and Property Characterization of Epitaxial MAX-Phase Thin Films from the Tin+1(Si, Ge, Sn)Cn Systems - 字舞流文

Growth and Property Characterization of Epitaxial MAX-Phase Thin Films from the Tin+1(Si, Ge, Sn)Cn Systems

J. Emmerlich | U. Jansson | L. Hultman | P. Eklund | H. Högberg | O. Wilhelmsson | J. Palmquist