Cathode lens electron microscopy: past and future

This retrospective sketches the evolution of emission electron microscopy, low energy electron microscopy and related methods from the early stages up to the present state and gives a brief outlook on the future possibilities of these cathode lens electron microscopy techniques. It is concerned mainly with instrumentation, discusses some little known work and emphasizes important steps in the evolution of the field instead of attempting to review it in detail.

[1]  G. Harp,et al.  Photoyield spectromicroscopy of silicon surfaces using monochromatic synchrotron radiation , 1989 .

[2]  L. Germer,et al.  Apparatus for Direct Observation of Low‐Energy Electron Diffraction Patterns , 1960 .

[3]  A. Recknagel Theorie des elektrischen Elektronenmikroskops für Selbststrahler , 1941 .

[4]  L. Reimer,et al.  Scanning Electron Microscopy , 1984 .

[5]  L. Veneklasen,et al.  Comparing cathode lens configurations for low energy electron microscopy , 1989 .

[6]  H. Liebl,et al.  Low-energy electron microscope of novel design , 1990 .

[7]  E. Bauer,et al.  Kinetics of the (7 × 7) (1 × 1) Transition on Si(111) , 1986 .

[8]  R. Schlögl,et al.  SMART: An Aberration-Corrected XPEEM/LEEM with Energy Filter , 1998 .

[9]  Y. Pennec,et al.  Exploring spin valve magnetization reversal dynamics with temporal, spatial and layer resolution: Influence of domain-wall energy , 2004 .

[10]  G. Massey,et al.  Space‐charge aberrations in the photoelectron microscope , 1981 .

[11]  M. Knoll,et al.  Untersuchung der Emissionsverteilung an Glühkathoden mit dem magnetischen Elektronenmikroskop , 1932 .

[12]  E. Bauer Interpretation of Low-Energy Electron Diffraction Patterns of Adsorbed Gases , 1961 .

[13]  Mark C. Reuter,et al.  Design of a new photo-emission/low-energy electron microscope for surface studies , 1991 .

[14]  E. Bauer,et al.  Emission and Low Energy Reflection Electron Microscopy , 1988 .

[15]  G. Schönhense,et al.  Investigating surface magnetism by means of photoexcitation electron emission microscopy , 2002 .

[16]  B. Tonner,et al.  A photoemission microscope with a hemispherical capacitor energy filter , 1997 .

[17]  G. Rempfer,et al.  Photoelectron microscopy: a new approach to mapping organic and biological surfaces. , 1972, Proceedings of the National Academy of Sciences of the United States of America.

[18]  E. Bauer,et al.  The (7 × 7) ↔ (1 × 1) phase transition on Si(111) , 1985 .

[19]  T. Tyliszczak,et al.  X-ray spectromicroscopy of immiscible polymer blends: polystyrene–poly(methyl methacrylate) , 2001 .

[20]  Howard A. Padmore,et al.  Photoemission electron microscope for the study of magnetic materials , 1999 .

[21]  H. Oepen,et al.  Magnetic Microscopy of Nanostructures , 2005 .

[22]  K. Grzelakowski,et al.  A new surface microscope for magnetic imaging , 1994 .

[23]  L. Germer,et al.  Oxygen on Nickel , 1960 .

[24]  G. Massey Measurement of laser photoelectron image degradation at high current densities , 1983 .

[25]  Alexander M. Bradshaw,et al.  XPEEM WITH ENERGY-FILTERING: ADVANTAGES AND FIRST RESULTS FROM THE SMART PROJECT , 2002 .

[26]  G. Hottenroth Untersuchungen über Elektronenspiegel , 1937 .

[27]  Jun Feng,et al.  Photoemission Electron Microscopy (PEEM) , 2007 .

[28]  Oliver G. Schmidt,et al.  Microspectroscopy and spectromicroscopy with photoemission electron microscopy using a new kind of imaging energy filter , 2001 .

[29]  G. Harp,et al.  X‐ray absorption near edge structures of intermediate oxidation states of silicon in silicon oxides during thermal desorption , 1990 .

[30]  Eric Munro,et al.  Electron optics for high throughput low energy electron microscopy , 2007 .

[31]  G. Schönhense Imaging of magnetic structures by photoemission electron microscopy , 1999 .

[32]  V. Kolarik,et al.  Electron-optical properties of multiple magnetic prism systems , 1990 .

[33]  E. Bauer,et al.  Compact low-energy electron microscope for surface imaging , 1998 .

[34]  M. Kordesch,et al.  A UHV-compatible photoelectron emission microscope for applications in surface science , 1991 .

[35]  E. Bauer,et al.  The growth of Si on Si(100): a video-LEEM study , 1991 .

[36]  W. Skoczylas,et al.  A proposed modular imaging system for photoelectron and electron probe microscopy with aberration correction, and for mirror microscopy and low-energy electron microscopy , 1991 .

[37]  A. Scholl,et al.  Vortex Core-Driven Magnetization Dynamics , 2004, Science.

[38]  E. Bauer,et al.  Low energy electron microscopy , 1994 .

[39]  E. Bauer The possibilities for analytical methods in photoemission and low-energy microscopy , 1991 .

[40]  E. Bauer,et al.  Low energy electron microscopy of surface processes , 1990 .

[41]  O H Griffith,et al.  Historical perspective and current trends in emission microscopy, mirror electron microscopy and low-energy electron microscopy. An introduction to the proceedings of the Second International Symposium and Workshop on Emission microscopy and Related Techniques. , 1991, Ultramicroscopy.

[42]  W. Turner,et al.  Absorption Data of Laser‐Type GaAs at 300° and 77°K , 1964 .

[43]  A. Recknagel Das Auflösungsvermögen des Elektronenmikroskops für Selbststrahler , 1943 .

[44]  A. Sosin,et al.  Threshold Displacement Energies and Subthreshold Displacements in Copper and Gold Near 10°K , 1964 .

[45]  V. Zworykin On electron optics , 1933 .

[46]  T. Ichinokawa,et al.  Development of a Low Energy Electron Microscope with an Energy Analyzer , 1998 .

[47]  H. Padmore,et al.  An x-ray photoemission electron microscope using an electron mirror aberration corrector for the study of complex materials , 2004 .

[48]  E. Bauer Interaction of slow electrons with surfaces , 1970 .

[49]  J. Hofmeister,et al.  Zum einfluss der kristallographischen orientierung auf den vektoriellen photoeffekt , 1975 .

[50]  H. Rose,et al.  Outline of a versatile corrected LEEM , 1992 .

[51]  G. Birrell,et al.  Bibliography on emission microscopy, mirror electron microscopy, low-energy electron microscopy and related techniques: 1985–1991 , 1991 .

[52]  E. Bauer,et al.  An analytical reflection and emission UHV surface electron microscope , 1985 .

[53]  O. Scherzer Spharische und chromatische Korrektur von Elektronen-Linsen , 1947 .

[54]  G. Massey,et al.  Nonlinear photoemission for viewing guided or evanescent waves , 1981 .

[55]  G. Harp,et al.  Photoelectron microscopy with synchrotron radiation , 1988 .

[56]  Yoshio Takahashi,et al.  Mirror electron microscope for inspecting nanometer-sized defects in magnetic media , 2008 .

[57]  E. Bauer The resolution of the low energy electron reflection microscope , 1985 .

[58]  G. R. Harp,et al.  Element-Specific Magnetic Microscopy with Circularly Polarized X-rays , 1993, Science.

[59]  E. Beaurepaire,et al.  Magnetism : a synchrotron radiation approach , 2006 .

[60]  M. Klaua,et al.  Photo-electron emission microscopy of work function changes , 1983 .

[61]  G. Lorusso,et al.  MEPHISTO: Performance tests of a novel synchrotron imaging photoelectron spectromicroscope , 1998 .

[62]  A. Locatelli,et al.  Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM , 2008 .

[63]  U. Valdré,et al.  Surface and Interface Characterization by Electron Optical Methods , 1989 .

[64]  M. Reuter,et al.  A New Low Energy Electron Microscope , 1998 .

[65]  G. Rempfer,et al.  Low‐energy electron microscopy (LEEM) and mirror electron microscopy (MEM) of biological specimens: Preliminary results with a novel beam separating system , 1992, Journal of microscopy.

[66]  E. Bauer,et al.  Spin Polarized Low Energy Electron Microscopy of Surface Magnetic Structure , 1988 .

[67]  G. Rempfer A theoretical study of the hyperbolic electron mirror as a correcting element for spherical and chromatic aberration in electron optics , 1990 .

[68]  W. Koch Ein hochauflösendes Emissions-Mikroskop zur Sichtbarmachung von Oberflächen mit UV-ausgelösten Elektronen , 1958 .

[69]  F. Lenz,et al.  Electron Emission Microscopy , 1963 .

[70]  L. Veneklasen Design of a spectroscopic low-energy electron microscope , 1991 .

[71]  U. Kleineberg,et al.  Time-of-flight photoelectron emission microscopy TOF-PEEM: first results , 1998 .

[72]  H. Ade,et al.  A Free Electron Laser-Photoemission Electron Microscope System (FEL-PEEM) , 1998 .

[73]  J. Cazaux,et al.  Microscope photoélectronique pour l'analyse chimique des surfaces , 1973 .

[74]  G. Schönhense Surface magnetism studied by photoelectron spectromicroscopy with high spatial and time resolution , 2004 .

[75]  E. Brüche Elektronenmikroskopische Abbildung mit lichtelektrischen Elektronen , 1933 .

[76]  G. Schönhense,et al.  Multipole WIEN-filter for a high-resolution X-PEEM , 1997 .

[77]  R. Burger,et al.  Application of the Ion Bombardment Cleaning Method to Titanium, Germanium, Silicon, and Nickel as Determined by Low‐Energy Electron Diffraction , 1958 .

[78]  M. Kiskinova,et al.  Photoelectron microscopy and applications in surface and materials science , 2002 .

[79]  L. Germer,et al.  Improved Low Energy Electron Diffraction Apparatus , 1960 .

[80]  K. Grzelakowski,et al.  A flange‐on type low energy electron microscope , 1996 .

[81]  W. Mecklenburg Über das elektrostatische Emissions-Übermikroskop , 1943 .

[82]  D. R. Cruise A Numerical Method for the Determination of an Electric Field about a Complicated Boundary , 1963 .

[83]  V. Kolarik,et al.  Close packed prism arrays for electron microscopy , 1991 .

[84]  K. Grzelakowski The novel surface science instrument: Double reflection electron emission microscope , 1999 .