A Novel Calibration Method for Object Plane Tilt Angle Measurement in Microscope System

A novel calibration method is proposed to measure object plane tilt angle in microscope system with small-depth-field. The proposed method is constructed by a space model about calibration board and the surface of image. Only a rotating disk, a goniometer and a calibration board with some features are needed, the tilt angle between the object plane and image plane and their geometric relationship can be estimated by the space model. Compared with some classical calibration methods with expensive equipment, the proposed method is easy to be implemented with relative cheap equipments. Moreover, it has been proved that the proposed method is quite efficient through experimental verification. It can also contribute to three dimensional applications in computer vision of microsystems.

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