论文信息 - Temperature-Dependence Measurement of Anisotropic Complex Permittivity for Mic Dielectric Substrate

Temperature-Dependence Measurement of Anisotropic Complex Permittivity for Mic Dielectric Substrate

Temperature dependence of anisotropic complex permittivity is measured for a copper-clad laminate substrate in the microwave range. Measurements normal and tangential to the substrate are performed accu- rately by using a balanced type circular disk resonator with the TWlo mode and a circular cavity with the mode, respectively.

Yoshio Kobayashi | J. Yu

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