A model of voltage-dependent dielectric losses for ferroelectric MMIC devices
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James F. Scott | J. Scott | L. Mcmillan | Galt David | Price JohnC. | Beall JamesA. | Ono RonaldH. | Paz de Araujo CarlosA. | L D McMillan | P. CarlosA. | P. JohnC. | G. David | Beall JamesA. | Ono RonaldH.
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