论文信息 - An optimal multiline TRL calibration algorithm

An optimal multiline TRL calibration algorithm

We examine the performance of two on-wafer multiline Thru-Reflect-Line (TRL) calibration algorithms: the popular multiline TRL algorithm implemented in the MultiCal/spl reg/ software package, and a newly implemented iterative algorithm designed to give optimal results in the presence of measurement noise. We show that the iterative algorithm outperforms the MultiCal software in the presence of measurement noise, and verify its uncertainty estimates.

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