Electromigration and Parasitic-Aware ILP Router for Analog and RF Circuits

Interconnect and via failures due to the electromigration (EM) effect have become very challenging in the advanced technology as a result of shrinking feature size of integrated circuit. The parasitic effects, which have to be normally represented as analog and radio frequency (RF) circuit constraints for effective suppression in practice, have also made the modern physical design more complicated. In this paper, we present a new integer-linear-programming (ILP) based electromigration- and parasitic-aware analog/RF router, which can effectively address the EM constraints as well as interconnect parasitics along the routing paths. The experimental results show that our proposed method is able to produce better circuit performance compared to the previous work while EM can be addressed for analog/RF circuits.