Computer aided analysis of electron diffraction patterns on orientation relationship in multi-phase materials

A program for use with a personal computer system has been developed, which enables one to analyze orientation relationships between two or more phases. Electron diffraction patterns of each phase are simulated and superimposed to obtain the same patterns taken by the transmission electron microscopy, which are transfered into stereographic projections to show three-dimentional orientation relationships. This is usefully applied to clarify orientation relationships between precipitates and a matrix.