Experimental and statistical study in adhesion features of bonded interfaces of IC packages

Abstract The existence of defects in the corresponding interfaces can gradually degrade the interfacial adhesion when the flip chip package is exposed to the high temperature and humidity. This study used the fuzzy controller to stabilize both the moisture weight gain and adhesion strength together for the button shear test specimen. Parameters design, although based on the Taguchi method, can optimize the performance characteristic through the setting of process parameters and can reduce the sensitivity of the system performance to sources of variation. However, most published Taguchi applications to date have been concerned with the optimization of a single performance characteristic only. For example, it is only concerned a single performance characteristic with the optimization of the adhesion strength or the moisture gain weight individually. In this study, the control rules of the fuzzy controller were formed using the authors’ experience and knowledge of the IC packaging process. The control parameters to be tuned were the membership functions. Therefore, the controller’s performance depended on the membership functions. The fuzzy controller combined Taguchi parameter design, which makes the control performance insensitive to the operating condition changes and noise was used to determine the membership functions.

[1]  Shijian Luo,et al.  Fundamental adhesion issues for advanced flip chip packaging , 2002, 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).

[2]  T. R. Bement,et al.  Taguchi techniques for quality engineering , 1995 .

[3]  Y. S. Tarng,et al.  The Use of Fuzzy Logic in the Taguchi Method for the Optimisation of the Submerged Arc Welding Process , 2000 .

[4]  N. Logothetis,et al.  Managing for total quality : from Deming to Taguchi and SPC , 1992 .

[5]  M. Wahab,et al.  Coupled stress-diffusion analysis for durability study in adhesively bonded joints , 2002 .

[6]  A. Kinloch Adhesion and Adhesives: Science and Technology , 2010 .

[7]  Y. Chen,et al.  Thermomechanical behavior of underfill/solder mask/substrate interface under thermal cycling , 2004 .

[8]  Z. Cheng,et al.  Underfill delamination analysis of flip chip on low-cost board , 2001, Advances in Electronic Materials and Packaging 2001 (Cat. No.01EX506).

[9]  B. Martin,et al.  Micro-mechanical characterizations of solder mask materials , 2000, Proceedings of 3rd Electronics Packaging Technology Conference (EPTC 2000) (Cat. No.00EX456).

[10]  Ranjan Rajoo,et al.  The mechanics and impact of hygroscopic swelling of polymeric materials in electronic packaging , 2000, 2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070).

[11]  Yung-Chang Chen,et al.  Influences of the moisture absorption on PBGA package's warpage during IR reflow process , 2003, Microelectron. Reliab..

[12]  W. K. Szeto,et al.  Interface failure criterion of button shear test as a means of interface adhesion measurement in plastic packages , 2000, International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458).

[13]  Chuen-Chien Lee FUZZY LOGIC CONTROL SYSTEMS: FUZZY LOGIC CONTROLLER - PART I , 1990 .

[14]  C.P. Wong,et al.  Influence of temperature and humidity on adhesion of underfills for flip chip packaging , 2005, IEEE Transactions on Components and Packaging Technologies.

[15]  Ephraim Suhir The Future of Microelectronics and Photonics and the Role of Mechanics and Materials , 1998 .

[16]  C. Wong,et al.  Experimental investigation of time dependent degradation of coupling agent bonded interfaces , 2001, 2001 Proceedings. 51st Electronic Components and Technology Conference (Cat. No.01CH37220).

[17]  J. Mendel Fuzzy logic systems for engineering: a tutorial , 1995, Proc. IEEE.

[18]  W.T. Chen,et al.  Evaluation of plastic package delamination via reliability testing and fracture mechanics approach , 1997, 1997 Proceedings 47th Electronic Components and Technology Conference.

[19]  T. Y. Lin,et al.  The impact of moisture in mold compound preforms on the warpage of PBGA packages , 2004, Microelectron. Reliab..

[20]  S. Chen,et al.  The Geometrical Effects of Bumps on the Fatigue Life of Flip-chip Packages by Taguchi Method , 2005 .

[21]  Willem D. van Driel,et al.  Characterization and Modelling of Moisture Driven Interface Failures , 2004, Microelectron. Reliab..

[22]  Adhesion study on underfill encapsulant affected by flip chip assembly variables , 2001, Proceedings International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces (IEEE Cat. No.01TH8562).

[23]  Yung-Chang Chen,et al.  Stability of the warpage in a PBGA package subjected to hygro-thermal loading , 2006, Microelectron. Reliab..

[24]  I. C. Ume,et al.  Finite element analysis of PWB warpage due to the solder masking process , 1997 .

[25]  Chieh Kung,et al.  Optimal dimension of PQFP by using Taguchi method , 2000 .