Single event effect testing and radiation-hardened designing of several commercial optical transceivers
暂无分享,去创建一个
[1] Kenneth A. LaBel,et al. Single event effect testing of the Intel 80386 family and the 80486 microprocessor , 1995 .
[2] Farokh Irom,et al. Single Event Effect and Total Ionizing Dose Results of Highly Scaled Flash Memories , 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).
[3] Mathias Pez,et al. 10 Gbps multiple channel optical transceivers for harsh environment applications , 2014, 2014 IEEE Avionics, Fiber-Optics and Photonics Technology Conference (AVFOP).
[4] B.L. Bhuva,et al. Single-Event Effect Mitigation in Switched-Capacitor Comparator Designs , 2008, IEEE Transactions on Nuclear Science.
[5] James L. Rash,et al. Internet technology for future space missions , 2002, Comput. Networks.
[6] Hsiao-Hwa Chen,et al. Security in space information networks , 2015, IEEE Commun. Mag..
[7] D. Louderback,et al. Scalable coarse WDM transceiver modules for satellite applications , 2009, 2009 IEEE/LEOS Winter Topicals Meeting Series.
[8] S.K. Moyer,et al. Total Dose and Single Event Effect Characterization of ECL Devices , 2008, 2008 IEEE Radiation Effects Data Workshop.
[9] E. G. Stassinopoulos,et al. Single event effect test results for candidate spacecraft electronics , 1997, 1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference.
[10] Michael J. Wale. Options and trends for PON tunable optical transceivers , 2011, 2011 37th European Conference and Exhibition on Optical Communication.