Effect of residual chips on the material removal process of the bulk metallic glass studied by in situ scratch testing inside the scanning electron microscope
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Hongwei Zhao | Hu Huang | Chengli Shi | Boda Wu | Fan Zunqiang | Shunguang Wan | Hu Huang | Hongwei Zhao | Chengli Shi | Chunyang Geng | C. Geng | S. Wan | Fan Zunqiang | Boda Wu
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