Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control Systems

This article describes an evaluation method for reliability and hazard rate of lifetime distribution confidence lower limits for electronic stability control (ESC) system using test data from multistage and subsystems. This method provides estimation that can potentially and significantly reduce the amount of testing, without sacrificing the one-sided confidence level of reliability. This also allows quicker design verification and validation for ESC systems. The method is derived under the assumption that the reliability parameter is a random variable with a given distribution function, and the product's reliability increases monotonously during the development process. This new method is applied to the analysis of reliability of an ESC system. Copyright © 2012 John Wiley & Sons, Ltd.

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