Chip measuring sorting system and method

The invention provides chip measuring sorting system and method. The system comprises a sorting device, a measuring device and a carrying device, wherein the sorting device and the measuring device are adjacent to each other; a first storing seat is arranged in the measuring device, and while a second sorting seat is arranged in the sorting device; the carrying device is adjacent to a positioning access device; a first carrying platform is arranged on the carrying device, and while a second carrying platform is arranged on the positioning access device to carry and position a standard device; the carrying device is adjacent to the storing device; a picking rotating arm is arranged between the carrying device and the sorting device; the positioning access device is arranged adjacent to a tool frame assembly, and a second mechanical arm is arranged between the positioning access device and the device frame assembly; a standard device and a central control system which is connected with all the devices above are stored in the device frame assembly. With the adoption of the system, the problems of low production efficiency and relatively high production cost due to repeated setting of a cabinet and wafer scanning during measuring and sorting chips in the prior art can be solved.