论文信息 - In-plane displacement measurement configuration with twofold sensitivity.

In-plane displacement measurement configuration with twofold sensitivity.

An optical configuration is suggested that will achieve a twofold increase in sensitivity when one measures an in-plane displacement component of a deformation vector compared with the Leendertz two-beam illumination method. A theory and experimental demonstration of the method are presented.

R S Sirohi | N K Mohan

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