Building the Auto test platform of Xilinx XC4000 FPGAs

With the development of FPGAs, testing technology for FPGAs has been developing. Because the structures of FPGAs are different from ASIC, the DFT circuits cannot be implemented. Its ability of programmable determines that the test circuits can be implemented by programming. This paper discusses the testing methods for interconnects and CLB of Xilinx XC400 serial FPGAs. A new TC to DC method is provided. The hardware flat is built. Testing a real FPGA chip is achieved.