Towards quantitative determination of the spring constant of a scanning force microscope cantilever with a microelectromechanical nano-force actuator
暂无分享,去创建一个
Sai Gao | Konrad Herrmann | Zhikai Zhang | K. Herrmann | Zhikai Zhang | Yong Wu | S. Gao | Yong Wu
[1] J. Sader. Frequency response of cantilever beams immersed in viscous fluids with applications to the atomic force microscope , 1998 .
[2] J. Sader,et al. Calibration of rectangular atomic force microscope cantilevers , 1999 .
[3] G. Palmese,et al. Relating elastic modulus to indentation response using atomic force microscopy , 1997 .
[4] M. Rief,et al. Reversible unfolding of individual titin immunoglobulin domains by AFM. , 1997, Science.
[5] John Hedley,et al. Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration , 2004 .
[6] N. Gu,et al. Probing nanomechanical properties of nickel coated bacteria by nanoindentation , 2007 .
[7] Martin P. Seah,et al. The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis , 2005 .
[8] S. Okuma,et al. A method for determining the spring constant of cantilevers for atomic force microscopy , 1996 .
[9] William C. Tang,et al. Electrostatic-comb drive of lateral polysilicon resonators , 1990 .
[10] M. Ho,et al. Atomic force microscopic observation of surface-supported human erythrocytes , 2007 .
[11] J. Bechhoefer,et al. Erratum: ‘‘Calibration of atomic‐force microscope tips’’ [Rev. Sci. Instrum. 64, 1868 (1993)] , 1993 .
[12] John Hedley,et al. Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI , 2003, Nanotechnology.
[13] M. Seah,et al. Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurement via AFM nanoindentation , 2005 .
[14] Sai Gao,et al. DEVELOPMENT OF A MICRO-MINIATURE NANOINDENTATION INSTRUMENT , 2007 .
[15] G. Ferrari,et al. Nanoscale capacitance imaging with attofarad resolution using ac current sensing atomic force microscopy. , 2006, Nanotechnology.
[16] J. Bechhoefer,et al. Calibration of atomic‐force microscope tips , 1993 .
[17] William C. Tang,et al. Laterally Driven Polysilicon Resonant Microstructures , 1989 .
[18] Richard S Gates,et al. Precise atomic force microscope cantilever spring constant calibration using a reference cantilever array. , 2007, The Review of scientific instruments.
[19] P. Hansma,et al. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy , 1993 .
[20] John Hedley,et al. Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibration , 2003 .
[21] Hans-Jürgen Butt,et al. Calculation of thermal noise in atomic force microscopy , 1995 .
[22] Karla Hiller,et al. Bonding and deep RIE: a powerful combination for high-aspect-ratio sensors and actuators , 2005, SPIE MOEMS-MEMS.
[23] J. Sader,et al. Method for the calibration of atomic force microscope cantilevers , 1995 .
[24] James D. Holbery,et al. Experimental determination of scanning probe microscope cantilever spring constants utilizing a nanoindentation apparatus , 2000 .
[25] Matthias Rief,et al. Single Molecule Force Spectroscopy on Polysaccharides by Atomic Force Microscopy , 1997, Science.
[26] Frank L. Lewis,et al. The lateral instability problem in electrostatic comb drive actuators: modeling and feedback control , 2006 .