OP-ELM: Theory, Experiments and a Toolbox

This paper presents the Optimally-Pruned Extreme Learning Machine (OP-ELM) toolbox. This novel, fast and accurate methodology is applied to several regression and classification problems. The results are compared with widely known Multilayer Perceptron (MLP) and Least-Squares Support Vector Machine (LS-SVM) methods. As the experiments (regression and classification) demonstrate, the OP-ELM methodology is considerably faster than the MLP and the LS-SVM, while maintaining the accuracy in the same level. Finally, a toolbox performing the OP-ELM is introduced and instructions are presented.