Emissivity measurements of shocked tin using a multi-wavelength integrating sphere

Pyrometric measurements of radiance to determine temperature have been performed on shock physics experiments for decades. However, multi-wavelength pyrometry schemes sometimes fail to provide credible temperatures in experiments, which incur unknown changes in sample emissivity, because an emissivity change also affects the spectral radiance. Hence, for shock physics experiments using pyrometry to measure temperatures, it is essential to determine the dynamic sample emissivity. The most robust way to determine the normal spectral emissivity is to measure the spectral normal-hemispherical reflectance using an integrating sphere. In this paper, we describe a multi-wavelength (1.6–5.0 μm) integrating sphere system that utilizes a “reversed” scheme, which we use for shock physics experiments. The sample to be shocked is illuminated uniformly by scattering broadband light from inside a sphere onto the sample. A portion of the light reflected from the sample is detected at a point 12 deg from normal to the sam...