论文信息 - Note: fast and reliable fracture strain extraction technique applied to silicon at nanometer scale. - 字舞流文

Note: fast and reliable fracture strain extraction technique applied to silicon at nanometer scale.

J. Raskin | T. Pardoen | V. Passi | M. Hagberg | U. Sodervall | B. Nilsson | G. Petersson | U. Bhaskar