论文信息 - A new on-wafer multiline thru-reflect-line (TRL) calibration standard design

A new on-wafer multiline thru-reflect-line (TRL) calibration standard design

By using invert microstrip, a new on wafer multiline TRL calibration kits for THz measurement are designed in this paper. Our approach is based on the multi-frequency formulation of the vector network analyzer calibration problem. The calibration kits are designed covers a range of frequencies from 70 to 220 GHz. The simulator results are given in this paper.

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