Insights into the structural, electronic, and magnetic properties of Fe2−xTixO3/Fe2O3 thin films with x = 0.44 grown on Al2O3 (0001)
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W. Kaplan | R. Pentcheva | C. Scheu | W. Moritz | M. Döblinger | A. Müller | M. Winklhofer | T. Cohen-Hyams | H. Nabi | M. Lübbe | T. Dennenwaldt | Maria Gandman