Progress Towards the Electron Counting Capacitance Standard at PTB

We report on the progress and new results in the setup of the electron counting capacitance standard (ECCS) at Physikalisch-Technische Bundesanstalt (PTB), Braunschweig, Germany. Considerable progress has been made in the operation of the single-electron circuit and in the incorporation of a cryogenic capacitor into the millikelvin refrigerator setup. The single-electron tunneling (SET) circuit comprised a five-junction, single-electron R-pump that showed an electron retention time of more than 600 s, and the circuit was successfully used for the deterministic shuttle transfer of charge packets consisting of few electrons. In addition, the cryogenic capacitor was tested, and its performance was found to be suitable for a high-precision ECCS experiment.

[1]  J. Martinis,et al.  A capacitance standard based on counting electrons , 1999, Conference on Precision Electromagnetic Measurements. Conference Digest. CPEM 2000 (Cat. No.00CH37031).

[2]  G. H. Rayner,et al.  Coaxial Ac Bridges , 1984 .

[4]  S. A. Bogoslovsky,et al.  Frequency-Locked Current of Cooper Pairs in Superconducting Single Electron Transistor with Ohmic Resistor , 2002 .

[5]  Alexander B. Zorin,et al.  Steps toward a capacitance standard based on single-electron counting at PTB , 2005, IEEE Transactions on Instrumentation and Measurement.

[7]  M. Keller.  Current status of the quantum metrology triangle , 2008 .

[8]  Alexander B. Zorin,et al.  Operation of a three-junction single-electron pump with on-chip resistors , 2001 .

[9]  John M. Martinis,et al.  Accuracy of electron counting using a 7‐junction electron pump , 1996 .

[10]  Gerd-Dietmar Willenberg,et al.  Stable cryogenic vacuum capacitor for single-electron charging experiments , 2001, IEEE Trans. Instrum. Meas..

[11]  Jensen,et al.  Metrological accuracy of the electron pump. , 1994, Physical review letters.

[12]  Frédéric Overney,et al.  Manipulating single electrons with a seven-junction pump , 2005, IEEE Transactions on Instrumentation and Measurement.

[13]  J. Martinis,et al.  Noise-induced leakage and counting errors in the electron pump , 2000 .

[14]  Brian J. Simonds,et al.  An upper bound to the frequency dependence of the cryogenic vacuum-gap capacitor , 2006 .

[15]  Gert Rietveld,et al.  DC and Low-Frequency Humidity Dependence of a 20 pF Air-Gap Capacitor , 2009, IEEE Transactions on Instrumentation and Measurement.

[16]  Aaas News,et al.  Book Reviews , 1893, Buffalo Medical and Surgical Journal.

[17]  N. Zimmerman,et al.  Uncertainty budget for the NIST electron counting capacitance standard, ECCS-1 , 2007 .