Evidence of weak Anderson localization revealed by the resistivity, transverse magnetoresistance and Hall effect measured on thin Cu films deposited on mica

[1]  R. Munoz,et al.  Size effects and charge transport in metals: Quantum theory of the resistivity of nanometric metallic structures arising from electron scattering by grain boundaries and by rough surfaces , 2017 .

[2]  E. Muñoz,et al.  The effect of electron scattering from disordered grain boundaries on the resistivity of metallic nanostructures , 2015 .

[3]  S. Oyarzún,et al.  Transverse magnetoresistance induced by electron-surface scattering on thin gold films: Experiment and theory , 2014 .

[4]  C. Gonzalez-Fuentes,et al.  Electron scattering at surfaces and grain boundaries in thin Au films , 2013 .

[5]  R. Munoz,et al.  Size effects in thin gold films: Discrimination between electron-surface and electron-grain boundary scattering by measuring the Hall effect at 4 K , 2013 .

[6]  S. Oyarzún,et al.  Size effects on the Hall constant in thin gold films , 2010 .

[7]  S. Oyarzún,et al.  Longitudinal magnetoresistance of thin gold films deposited on mica arising from electron-surface scattering , 2010 .

[8]  S. Oyarzún,et al.  Size effects under a strong magnetic field: Hall effect induced by electron-surface scattering on thin gold films deposited onto mica substrates under high vacuum. , 2006, Physical review letters.

[9]  S. Oyarzún,et al.  Size effects under a strong magnetic field: transverse magnetoresistance of thin gold films deposited on mica , 2006 .

[10]  R. Zárate,et al.  Titanium monoxide ultra-thin coatings evaporated onto polycrystalline copper films , 2004 .

[11]  Jinke Tang,et al.  Weak localization and magnetoresistance of island-like thin copper films , 2002 .

[12]  G. Bergmann,et al.  Weak localization in thin films: a time-of-flight experiment with conduction electrons , 1984 .

[13]  R. Rosenbaum,et al.  Magnetoresistance of thin copper films , 1983 .

[14]  G. Deutscher,et al.  Localization and negative magnetoresistance in thin copper films , 1982 .

[15]  G. Deutscher,et al.  Two-Dimensional Localization in Thin Copper Films , 1981 .

[16]  M. Shatzkes,et al.  Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces , 1970 .

[17]  A. Shepherd,et al.  Semiconductors , 1967, Nature.

[18]  E. Muñoz,et al.  The breakdown of Moore’s law induced by weak Anderson localization and by size effects in nano-scale metallic connectors , 2021 .

[19]  Z. R.A.,et al.  Titanium monoxide ultra-thin coatings evaporated onto polycrystalline copper films , 2004 .

[20]  G. Bergmann.  Weak Localization in Thin Films , 1986 .

[21]  J. Bell,et al.  Experiment and Theory , 1968 .