The sensitivity of a method to predict a capacitor's frequency characteristic

Several groups have worked on the characterization of four terminal-pair (4TP) capacitance standards at high frequencies. This paper describes a variation of the technique to predict a capacitor's frequency characteristic. The method is sensitive to regression parameter selection and the paper gives a detailed analysis of the techniques used to calculate reasonable values for these parameters. The results of the analysis of the capacitor frequency characteristic prediction method's sensitivity to exponent parameter variation have shown that this sensitivity is a major uncertainty component in the uncertainty analysis of NIST's capacitance standard measurement system.