RePRAM: Re-cycling PRAM faulty blocks for extended lifetime
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[1] Anoop Gupta,et al. The SPLASH-2 programs: characterization and methodological considerations , 1995, ISCA.
[2] Randy H. Katz. RAID: A Personal Recollection of How Storage Became a System , 2010, IEEE Ann. Hist. Comput..
[3] Vijayalakshmi Srinivasan,et al. Enhancing lifetime and security of PCM-based Main Memory with Start-Gap Wear Leveling , 2009, 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).
[4] H. Howie Huang,et al. Energy-aware writes to non-volatile main memory , 2011, OPSR.
[5] Engin Ipek,et al. Dynamically replicated memory: building reliable systems from nanoscale resistive memories , 2010, ASPLOS XV.
[6] Seung-Yun Lee,et al. A Low Power Phase-Change Random Access Memory using a Data-Comparison Write Scheme , 2007, 2007 IEEE International Symposium on Circuits and Systems.
[7] YangJun,et al. A durable and energy efficient main memory using phase change memory technology , 2009 .
[8] Onur Mutlu,et al. Architecting phase change memory as a scalable dram alternative , 2009, ISCA '09.
[9] Burton H. Bloom,et al. Space/time trade-offs in hash coding with allowable errors , 1970, CACM.
[10] Shih-Hung Chen,et al. Phase-change random access memory: A scalable technology , 2008, IBM J. Res. Dev..
[11] Sean Eilert,et al. Phase Change Memory: A New Memory Enables New Memory Usage Models , 2009, 2009 IEEE International Memory Workshop.
[12] Jun Yang,et al. A durable and energy efficient main memory using phase change memory technology , 2009, ISCA '09.
[13] Jun Yang,et al. LLS: Cooperative integration of wear-leveling and salvaging for PCM main memory , 2011, 2011 IEEE/IFIP 41st International Conference on Dependable Systems & Networks (DSN).
[14] Kai Li,et al. The PARSEC benchmark suite: Characterization and architectural implications , 2008, 2008 International Conference on Parallel Architectures and Compilation Techniques (PACT).
[15] Tao Li,et al. Characterizing and mitigating the impact of process variations on phase change based memory systems , 2009, 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).
[16] Karin Strauss,et al. Use ECP, not ECC, for hard failures in resistive memories , 2010, ISCA.
[17] Rami G. Melhem,et al. RDIS: A recursively defined invertible set scheme to tolerate multiple stuck-at faults in resistive memory , 2012, IEEE/IFIP International Conference on Dependable Systems and Networks (DSN 2012).
[18] Vijayalakshmi Srinivasan,et al. Scalable high performance main memory system using phase-change memory technology , 2009, ISCA '09.
[19] H. Howie Huang,et al. rPRAM: Exploring Redundancy Techniques to Improve Lifetime of PCM-based Main Memory , 2011, 2011 International Conference on Parallel Architectures and Compilation Techniques.
[20] Yuanyuan Zhou,et al. SafeMem: exploiting ECC-memory for detecting memory leaks and memory corruption during production runs , 2005, 11th International Symposium on High-Performance Computer Architecture.
[21] Nikolai Joukov,et al. RAIF: Redundant Array of Independent Filesystems , 2007, 24th IEEE Conference on Mass Storage Systems and Technologies (MSST 2007).
[22] Wei Wu,et al. Reducing cache power with low-cost, multi-bit error-correcting codes , 2010, ISCA.
[23] Randy H. Katz,et al. A case for redundant arrays of inexpensive disks (RAID) , 1988, SIGMOD '88.
[24] Hyunjin Lee,et al. Flip-N-Write: A simple deterministic technique to improve PRAM write performance, energy and endurance , 2009, 2009 42nd Annual IEEE/ACM International Symposium on Microarchitecture (MICRO).
[25] Hsien-Hsin S. Lee,et al. Security refresh: prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping , 2010, ISCA.
[26] H KatzRandy,et al. A case for redundant arrays of inexpensive disks (RAID) , 1988 .
[27] Norman P. Jouppi,et al. FREE-p: Protecting non-volatile memory against both hard and soft errors , 2011, 2011 IEEE 17th International Symposium on High Performance Computer Architecture.
[28] Hsien-Hsin S. Lee,et al. SAFER: Stuck-At-Fault Error Recovery for Memories , 2010, 2010 43rd Annual IEEE/ACM International Symposium on Microarchitecture.