Hard x-ray nanoprobe: a scanning hard x-ray microscopy beamline offering multi-modal imaging capabilities at 10 nm

Scanning hard x-ray microscopy is a versatile imaging tool that offers a suite of analytic x-ray techniques for studying spatially-resolved elemental, structural and chemical variations. Recent advances in nano-focusing optics and instrumentation have pushed the frontier of the field into multi-modal imaging in 3D and with nanoscale resolution. Here we present current imaging capabilities provided by the hard x-ray nanoprobe of the National Synchrotron Light Source II at Brookhaven National Laboratory. A variety of imaging modalities (absorption, phase, fluorescence and diffraction) will be discussed, as well as the data analysis challenges associated with them. We show that x-ray imaging at about 10 nm resolution has become routine measurements at the beamline, and has been used for a wide spectrum of scientific applications.

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