A novel BJT structure for high- performance analog circuit applications
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Sung-Kyu Kwon | Jae-Nam Yu | Hi-Deok Lee | Jung-Hwan Lee | Ga-Won Lee | Ho-Young Kwak | Jae-Hyung Jang | Seung-Yong Sung | Jong-Kwan Shin | Hyuk-Min Kwon | In-Shik Han | Seon-Man Hwang | Yi-Sun Chung
[1] M.J.M. Pelgrom,et al. Matching properties of MOS transistors , 1989 .
[2] Hi-Deok Lee,et al. Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications , 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.
[3] Sung-Kyu Kwon,et al. A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications , 2012, IEEE Transactions on Semiconductor Manufacturing.
[4] G. Lau,et al. Improvement of poly emitter n-p-n transistor matching in a 0.6 micron mixed signal technology , 2003, International Conference on Microelectronic Test Structures, 2003..
[5] N. Wils,et al. Identification and analysis of a new BJT parametric mismatch phenomenon , 2005, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005..
[6] Marcel J. M. Pelgrom,et al. Matching properties of MOS transistors , 1989 .
[7] H. P. Tuinhout. Design of Matching Test Structures , 1994 .
[8] H. P. Tuinhout. Improving BiCMOS technologies using BJT parametric mismatch characterisation , 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).
[9] Colin C. McAndrew,et al. Rapid evaluation of the root causes of BJT mismatch , 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).
[10] H. P. Tuinhout. Design of matching test structures [IC components] , 1994, Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures.
[11] C. C. McAndrew,et al. Understanding MOSFET mismatch for analog design , 2003 .
[12] H. Tuinhout,et al. Measurement of lithographical proximity effects on matching of bipolar transistors , 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).