A novel BJT structure for high- performance analog circuit applications

A novel structure is proposed to improve the matching characteristics of bipolar junction transistor (BJT) based on CMOS technology for high performance analog circuit applications. This paper includes the analysis of electrical and matching characteristics in collector current density (JC), base current density (JB) and current gain (β). Although the collector current density JC of the proposed structure is similar to that of the conventional structure, the base current density JB is lower than that of conventional structure, which results in higher current gain. The matching characteristics of the collector current density and the current gain of the proposed structure showed improvement of about 12.22% and 36.43%, respectively compared with the conventional structure.

[1]  M.J.M. Pelgrom,et al.  Matching properties of MOS transistors , 1989 .

[2]  Hi-Deok Lee,et al.  Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications , 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.

[3]  Sung-Kyu Kwon,et al.  A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications , 2012, IEEE Transactions on Semiconductor Manufacturing.

[4]  G. Lau,et al.  Improvement of poly emitter n-p-n transistor matching in a 0.6 micron mixed signal technology , 2003, International Conference on Microelectronic Test Structures, 2003..

[5]  N. Wils,et al.  Identification and analysis of a new BJT parametric mismatch phenomenon , 2005, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005..

[6]  Marcel J. M. Pelgrom,et al.  Matching properties of MOS transistors , 1989 .

[7]  H. P. Tuinhout Design of Matching Test Structures , 1994 .

[8]  H. P. Tuinhout Improving BiCMOS technologies using BJT parametric mismatch characterisation , 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).

[9]  Colin C. McAndrew,et al.  Rapid evaluation of the root causes of BJT mismatch , 2000, ICMTS 2000. Proceedings of the 2000 International Conference on Microelectronic Test Structures (Cat. No.00CH37095).

[10]  H. P. Tuinhout Design of matching test structures [IC components] , 1994, Proceedings of 1994 IEEE International Conference on Microelectronic Test Structures.

[11]  C. C. McAndrew,et al.  Understanding MOSFET mismatch for analog design , 2003 .

[12]  H. Tuinhout,et al.  Measurement of lithographical proximity effects on matching of bipolar transistors , 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).