Signature Analysis Testing with Bottom-Top Exclusive Or Type MISR

Parallel signature analysers implemented as multiple input linear feedback shift registers (MISR) are very useful in compressing test response data. There are known two kinds of multiple linear shift registers differentiated by the means of realization of the linear feedback. There are External Exclusive OR (EE) and Internal Exclusive OR (IE) type MISRs respectively. This paper presents a bottom-top Exclusive OR (BTE) type MISR which uses only (t+1)/2 XOR gates in its linear feedback instead of t XOR gates used in EE or IE type MISR. An algebraic analysis of the operation and certain analytical results regarding the detection capability of a BTE type MISR are included. Infirmities of certain BTE type MISR with a reducible characteristic polynomial have been made.

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