Investigations on the langasite resonators by X-ray topography

In this paper the results of electrical measurements of the mass-loading influence on Y-cut langasite resonator parameters are compared with those obtained by X-ray topography analysis of the same resonators. Based on the Ballato's transmission-line analogs of the trapped-energy resonators vibrating in thickness-shear mode, the mass-loading effect on resonator characteristics was studied. The effective mass-loading, motional inductance and quality factor of langasite resonators were computed. Sawyer plan-parallel polished Y-cut langasite resonators with 14 mm diameter, 5 MHz resonant frequency, Au electrodes of 7 mm diameters and various thickness were used in experiments. X-ray topography measurements were performed by conventional transmission Laue setting using the white beam synchrotron radiation on fundamental, third and fifth overtones. The results are in agreement with those obtained by electrical measurements. The comparison of X-ray diffraction topography images previously performed on AT-cut quartz resonators with X-ray topographs on langasite resonators pointed out that the Y-cut langasite resonators are less influenced by the mass-loading than the AT-cut quartz resonators.

[1]  J. Détaint,et al.  Studies by x-ray topography of the mass-loading effect on quartz and langasite resonator parameters , 2002, 2002 IEEE Ultrasonics Symposium, 2002. Proceedings..

[2]  J. Détaint,et al.  X-ray topography studies on the influence of the mass-loading effect on resonator parameters , 2001, Proceedings of the 2001 IEEE International Frequncy Control Symposium and PDA Exhibition (Cat. No.01CH37218).

[3]  S. Slavov.  X-ray diffraction topography analysis of TS-TT vibrations in contoured AT-cut quartz resonators , 1998, Proceedings of the 1998 IEEE International Frequency Control Symposium (Cat. No.98CH36165).

[4]  G. Tendeloo,et al.  X-Ray Diffraction Topography , 1996 .

[5]  I. Mateescu,et al.  The contribution to the non-uniform distribution of motion effects obtained for the SC-cut quartz plates , 1996, Proceedings of 1996 IEEE International Frequency Control Symposium.

[6]  J. Détaint,et al.  New results on high perfection langasite crystals: studies of crystalline defects and mode shapes , 1995, Proceedings of the 1995 IEEE International Frequency Control Symposium (49th Annual Symposium).

[7]  J. Détaint,et al.  Study of gallium phosphate and langasite crystals and resonators by X-ray topography , 1994, Proceedings of IEEE 48th Annual Symposium on Frequency Control.

[8]  A. Ballato,et al.  Inclusion of non-uniform distribution of motion effects in the transmission-line analogs of the piezoelectric plate resonator: theory and experiment , 1994, Proceedings of IEEE 48th Annual Symposium on Frequency Control.

[9]  I. Mateescu,et al.  Non-uniform distribution of motion influence on the effective mass-loading in AT-cut quartz resonators , 1992, Proceedings of the 1992 IEEE Frequency Control Symposium.

[10]  S. Mallikarjun,et al.  Mass loading measurements of quartz crystal plates , 1989, Proceedings of the 43rd Annual Symposium on Frequency Control.

[11]  H. Tiersten,et al.  An Analysis of SC-Cut Quartz Trapped Energy Resonators with Rectangular Electrodes , 1981 .

[12]  B. Tanner.  X-Ray Diffraction Topography , 1976 .

[13]  H. F. Tiersten,et al.  Analysis of Trapped Energy Resonators Operating in Overtones of Coupled Thickness-Shear and Thickness-Twist , 1975 .

[14]  A. Ballato.  Transmission-Line Analogs for Stacked Piezoelectric Crystal Devices , 1972 .