High-Bandwidth Intermittent-Contact Mode Scanning Probe Microscopy Using Electrostatically-Actuated Microcantilevers

[1]  Philippe Dubois,et al.  Probe‐Based 3‐D Nanolithography Using Self‐Amplified Depolymerization Polymers , 2010, Advanced materials.

[2]  Seth R. Marder,et al.  Nanoscale Tunable Reduction of Graphene Oxide for Graphene Electronics , 2010, Science.

[3]  A. Knoll,et al.  Nanoscale Three-Dimensional Patterning of Molecular Resists by Scanning Probes , 2010, Science.

[4]  W. Häberle,et al.  High-throughput intermittent-contact scanning probe microscopy , 2010, Nanotechnology.

[5]  B. Gotsmann,et al.  Dynamic superlubricity and the elimination of wear on the nanoscale. , 2009, Nature nanotechnology.

[6]  H. Rothuizen,et al.  Design of Power-Optimized Thermal Cantilevers for Scanning Probe Topography Sensing , 2009, 2009 IEEE 22nd International Conference on Micro Electro Mechanical Systems.

[7]  A. Knoll,et al.  Relaxation kinetics of nanoscale indents in a polymer glass. , 2009, Physical review letters.

[8]  T. Ando,et al.  High-speed atomic force microscopy for nano-visualization of dynamic biomolecular processes , 2008 .

[9]  Theodore Antonakopoulos,et al.  Probe-based ultrahigh-density storage technology , 2008, IBM J. Res. Dev..

[10]  R. Oliver.  Advances in AFM for the electrical characterization of semiconductors , 2008 .

[11]  Teodor Gotszalk,et al.  Piezoresistive and self-actuated 128-cantilever arrays for nanotechnology applications , 2007 .

[12]  Zhuomin M. Zhang,et al.  Topography imaging with a heated atomic force microscope cantilever in tapping mode. , 2007, The Review of scientific instruments.

[13]  F. Degertekin,et al.  A new atomic force microscope probe with force sensing integrated readout and active tip , 2006 .

[14]  G. Fedder,et al.  Position control of parallel-plate microactuators for probe-based data storage , 2004, Journal of Microelectromechanical Systems.

[15]  E. Eleftheriou,et al.  Demonstration of thermomechanical recording at 641 Gbit/in/sup 2/ , 2004, IEEE Transactions on Magnetics.

[16]  C. Su,et al.  Studies of tip wear processes in tapping mode atomic force microscopy. , 2003, Ultramicroscopy.

[17]  V. Altuzar,et al.  Atmospheric pollution profiles in Mexico City in two different seasons , 2003 .

[18]  Degang Chen,et al.  Harmonic and power balance tools for tapping-mode atomic force microscope , 2001 .

[19]  B. Terris,et al.  Atomic force microscope-based data storage: track servo and wear study , 1998 .

[20]  Stephen Y. Chou,et al.  Nano-compact disks with 400 Gbit/in2 storage density fabricated using nanoimprint lithography and read with proximal probe , 1997 .

[21]  N. C. MacDonald,et al.  Microelectromechanical scanning probe instruments for array architectures , 1997 .

[22]  A. S. Hou,et al.  Tapping mode atomic force microscopy using electrostatic force modulation , 1996 .

[23]  C. Quate,et al.  Parallel atomic force microscopy using cantilevers with integrated piezoresistive sensors and integrated piezoelectric actuators , 1995 .

[24]  A. Sebastian,et al.  Real-Time Models of Electrostatically Actuated Cantilever Probes With Integrated Thermal Sensor for Nanoscale Interrogation , 2010, Journal of Microelectromechanical Systems.

[25]  M. J. Rost,et al.  Scanning probe microscopy at video-rate , 2008 .

[26]  INSTITUTE OF PHYSICS PUBLISHING , 2005 .