Structural evolution in Ge+ implantation amorphous Si

[1]  L. J. Chen,et al.  Evolution of structural order in germanium ion-implanted amorphous silicon layers , 2002 .

[2]  Lun-Lun Chen,et al.  CRYSTALLIZATION IN AMORPHOUS SILICON , 2002 .

[3]  D. Jacobson,et al.  Observations of structural order in ion-implanted amorphous silicon , 2001 .

[4]  L. J. Chen,et al.  Solid state amorphization in metal/Si systems , 2000 .

[5]  J. L. Robertson,et al.  High Resolution Radial Distribution Function of Pure Amorphous Silicon , 1999 .

[6]  Lun-Lun Chen,et al.  Mechanism of enhanced formation of C54–TiSi2 in high-temperature deposited Ti thin films on preamorphized (001)Si , 1999 .

[7]  M. Treacy,et al.  Paracrystallites found in evaporated amorphous tetrahedral semiconductors , 1998 .

[8]  E. Olsson,et al.  Strained SiGe-alloy layers formed by solid phase epitaxial growth of Ge+ ion implanted silicon , 1997 .

[9]  M. Treacy,et al.  Diminished Medium-Range Order Observed in Annealed Amorphous Germanium , 1997 .

[10]  Wolf,et al.  Thermodynamic Criterion for the Stability of Amorphous Intergranular Films in Covalent Materials. , 1996, Physical review letters.

[11]  J. M. Liang,et al.  Autocorrelation function analysis of phase formation in the initial stage of interfacial reactions of molybdenum thin films on (111)Si , 1994 .

[12]  Lombardo,et al.  Early stages of grain growth in ion-irradiated amorphous silicon. , 1991, Physical review letters.

[13]  Natoli,et al.  Structural investigation of a-Si and a-Si:H using x-ray-absorption spectroscopy at the Si K edge. , 1989, Physical review. B, Condensed matter.

[14]  A. Ajmera,et al.  Elimination of end‐of‐range and mask edge lateral damage in Ge+ preamorphized, B+ implanted Si , 1986 .

[15]  M. Popescu.  Large-scale modelling of amorphous germanium , 1985 .

[16]  Winer,et al.  Computer generation of structural models of amorphous Si and Ge. , 1985, Physical review letters.

[17]  A. Wright,et al.  A neutron diffraction study of the structure of evaporated amorphous germanium , 1982 .

[18]  R. Temkin,et al.  Amorphous germanium II. Structural properties , 1973 .

[19]  D. E. Polk,et al.  Tetrahedrally Coordinated Random-Network Structure , 1973 .

[20]  D. E. Polk,et al.  Structural model for amorphous silicon and germanium , 1971 .

[21]  S. C. Moss,et al.  Evidence of Voids Within the As-Deposited Structure of Glassy Silicon , 1969 .

[22]  A. Ourmazd,et al.  Bragg diffraction by amorphous silicon , 1987, Nature.

[23]  John M. Cowley,et al.  Auto-correlation analysis of high resolution electron micrographs of near-amorphous thin films , 1985 .

[24]  J. Ziegler.  Ion Implantation Science and Technology , 1984 .

[25]  B. Warren,et al.  X-Ray Diffraction , 2014 .