Reliability analysis of GaAs/AlGaAs HBTs under forward current/temperature stress
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M. E. Hafizi | D. C. Streit | A. K. Oki | Liem T. Tran | Donald K. Umemoto | K. H. Yen | M. E. Kim | A. Oki | D. Umemoto | D. Streit | M. Hafizi | L. M. Pawlowicz | L. Tran | L. Pawlowicz | M.E. Kim | K. H. Yen
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