PICA: Backside failure analysis of CMOS circuits using Picosecond Imaging Circuit Analysis
暂无分享,去创建一个
William V. Huott | Jeffrey A. Kash | Daniel R. Knebel | Stas Polonsky | James C. Tsang | M. K. Mc Manus | Steven E. Steen
[1] Pia Sanda,et al. The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA) , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[2] William Lo,et al. Laser beam backside probing of CMOS integrated circuits , 1999 .
[3] Leendert M. Huisman,et al. Diagnosis and characterization of timing-related defects by time-dependent light emission , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[4] J.A. Kash,et al. Full chip optical imaging of logic state evolution in CMOS circuits , 1996, International Electron Devices Meeting. Technical Digest.
[5] J. Kash,et al. Dynamic internal testing of CMOS circuits using hot luminescence , 1997, IEEE Electron Device Letters.
[6] J. A. Kash,et al. Backside optical emission diagnostics for excess I/sub DDQ/ , 1998 .
[7] D. Benson,et al. TIVA and SEI Developments for Enhanced Front and Backside Interconnection Failure Analysis , 1999 .
[8] J.A. Kash,et al. Picosecond imaging circuit analysis of the POWER3 clock distribution , 1999, 1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278).
[9] Kiyoshi Nikawa,et al. New capabilities of OBIRCH method for fault localization and defect detection , 1997, Proceedings Sixth Asian Test Symposium (ATS'97).