论文信息 - Voltage Ramp and Time-Dependent Dielectric Breakdown in Ultra-Narrow Cu/SiO2 Interconnects - 字舞流文

Voltage Ramp and Time-Dependent Dielectric Breakdown in Ultra-Narrow Cu/SiO2 Interconnects

H. Park | J. Bae | G. Choi | Hyunkwang Jung | Z.-S. Choi | J. Hong | B. Park | H. Lee | K. Choi | eung-Joon Lee | J.W. Kim | J. Lee | J. Moon