Interelement effects in X-ray fluorescence determination of the surface density of vanadium nanofilms on various substrates
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[1] A. Ershov,et al. An X-ray fluorescence method for determining the mass absorption coefficient in thin-film V/Ge and Cr/Ge bilayer systems , 2013, Inorganic Materials.
[2] N. I. Mashin,et al. Approaches to improving the accuracy in X-ray fluorescence analysis of Si1 − xGex films , 2010 .
[3] K. Hirokawa,et al. Effect of backing metals in the X-ray fluorescence spectral analysis of metal films and its application , 1964 .
[4] K. Hirokawa,et al. Simultaneous determination of alloy film thickness and its composition with X-Ray fluorescent spectroscopy , 1962 .