SoC — A real challenge for ESD protection?
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H. Gossner | K. Esmark | W. Stadler | P. Pessl | S. Druen | K. Domanski | C. Russ | F. Zangl
[1] E.R. Worley. Distributed gate ESD network architecture for inter-power domain signals , 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.
[2] W. Stadler,et al. Development strategy for TLU-robust products , 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.
[3] M. Stockinger,et al. Boosted and distributed rail clamp networks for ESD protection in advanced CMOS technologies , 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.
[4] Harald Gossner,et al. Advanced simulation methods for ESD protection development , 2003 .
[5] W. Fichtner,et al. Base pushout driven snapback in parasitic bipolar devices between different power domains , 2004, 2004 IEEE International Reliability Physics Symposium. Proceedings.
[6] Doris Schmitt-Landsiedel,et al. High abstraction level permutational ESD concept analysis , 2003, 2003 Electrical Overstress/Electrostatic Discharge Symposium.
[7] R. Gaertner,et al. From the ESD robustness of products to the system ESD robustness , 2004, 2004 Electrical Overstress/Electrostatic Discharge Symposium.
[8] C. Duvvury,et al. ESD and latch-up reliability for nanometer CMOS technologies , 2004, IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004..