Arsenic Clustering in Silicon
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Large decreases in the conductivity of arsenic‐doped silicon have been observed during 500–970°C heat treatments. The rate of conductivity change depends upon the prior quenching rate from diffusion temperature to room temperature. These conductivity changes are reversed by higher‐temperature treatments. The relationship between the electrically active arsenic, as calculated from the conductivity, and the total arsenic is shown to be consistent with a model of substitutional arsenic atoms being nonionized when in a cluster or in a complex involving one or more vacancies.
[1] M. Joshi,et al. Silicon defect structure induced by arsenic diffusion and subsequent steam oxidation , 1970 .
[2] S. Chou,et al. A STUDY OF DIFFUSED LAYERS OF ARSENIC AND ANTIMONY IN SILICON USING THE ION‐SCATTERING TECHNIQUE , 1970 .
[3] F. Trumbore,et al. Solid solubilities of impurity elements in germanium and silicon , 1960 .
[4] J. Irvin,et al. Resistivity of bulk silicon and of diffused layers in silicon , 1962 .