论文信息 - Statistical characterization of bit patterning in SOAs: BER prediction and experimental validation - 字舞流文

Statistical characterization of bit patterning in SOAs: BER prediction and experimental validation

We present a novel simulation tool for optical systems employing in-line nonlinear SOAs, able to correctly estimate the bit error rate even in the presence of significant SOA-induced intersymbol interference.

A. Bononi | A. Ghazisaeidi | L.A. Rusch | F. Vacondio

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