Physical Vapor Deposition
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[1] C. Ting,et al. Study of planarized sputter‐deposited SiO2 , 1978 .
[2] J. Cuomo,et al. Synthesis of compound thin films by dual ion beam deposition. I. Experimental approach , 1985 .
[3] P. S. Mcleod,et al. High‐rate sputtering of aluminum for metallization of integrated circuits , 1977 .
[4] W. D. Westwood,et al. Glow discharge sputtering , 1976 .
[5] J. Vossen. Contamination in Films Sputtered From Hot-Pressed Targets , 1971 .
[6] W. Heitmann. Reactive evaporation in ionized gases. , 1971, Applied optics.
[7] J. Coburn,et al. PLASMA DIAGNOSTICS OF AN rf-SPUTTERING GLOW DISCHARGE. , 1971 .
[8] N. Savvides,et al. Charged particle fluxes from planar magnetron sputtering sources , 1986 .
[9] R. Shimizu,et al. Monte Carlo Simulation Approach to Sputtering in Multi-Component Targets , 1985 .
[10] R. Hultgren,et al. Selected Values of Thermodynamic Properties of Metals and Alloys , 1963 .
[11] A. F. Hmiel,et al. Partial pressure control of reactively sputtered titanium nitride , 1985 .
[12] D. Mckenzie,et al. An interferometric investigation of the thermalization of copper atoms in a magnetron sputtering discharge , 1986 .
[13] N. Hosokawa,et al. Self-sputtering phenomena in high-rate coaxial cylindrical magnetron sputtering , 1977 .
[14] D. W. Hoffman,et al. The compressive stress transition in Al, V, Zr, Nb and W metal films sputtered at low working pressures☆ , 1977 .
[15] K. Müller. Monte Carlo calculation for structural modifications in ion‐assisted thin film deposition due to thermal spikes , 1986 .
[16] H. F. Winters,et al. Sputtering of chemisorbed gas (nitrogen on tungsten) by low‐energy ions , 1974 .
[17] G. Comşa. Spatial Initial Distribution of Ions in an MBAG and the Modulation Factor , 1971 .
[18] G. McCracken,et al. The behaviour of surfaces under ion bombardment , 1975 .
[19] D. W. Henderson,et al. Simulation of structural anisotropy and void formation in amorphous thin films , 1974 .
[20] E. J. Lloyd,et al. High temperature stability of PtSi formed by reaction of metal with silicon or by cosputtering , 1983 .
[21] K. Behrndt,et al. Automatic control of film-deposition rate with the crystal oscillator for preparation of alloy films☆ , 1962 .
[22] R. J. Gnaedinger. Some Calculations of the Thickness Distribution of Films Deposited from Large Area Sputtering Sources , 1969 .
[23] P. Ghate,et al. Magnetron-sputtered aluminum films for integrated circuit interconnections , 1979 .
[24] E. Dullni. Velocity distributions of the metal atoms sputtered from oxygen and nitrogen covered Ti- and Al-surfaces , 1984 .
[25] H. Leamy,et al. Columnar microstructure in vapor-deposited thin films , 1977 .
[26] R. Behrisch,et al. Sputtering by Particle Bombardment III , 1981 .
[27] E. H. C. Parker,et al. The Technology and physics of molecular beam epitaxy , 1985 .
[28] M. Hablanian. Comments on the history of vacuum pumps , 1984 .
[29] J. Thornton. Substrate heating in cylindrical magnetron sputtering sources , 1978 .
[30] D. W. Hoffman. Stress and property control in sputtered metal films without substrate bias , 1983 .
[31] G. Wehner,et al. Alloy Sputtering Studies with in situ Auger Electron Spectroscopy , 1971 .
[32] H. Yoshihara,et al. Enhanced ARE apparatus and TiN synthesis , 1979 .
[33] W. D. Davis,et al. Ion Energies at the Cathode of a Glow Discharge , 1963 .
[34] William Dallas Sproul,et al. Very high rate reactive sputtering of TiN, ZrN and HfN , 1983 .
[35] R. Messier,et al. Are thin film physical structures fractals , 1985 .
[36] I. Blech,et al. Step coverage simulation and measurement in a dc planar magnetron sputtering system , 1983 .
[37] R. S. Robinson,et al. Mean free path of negative ions in diode sputtering , 1978 .
[38] L. Maissel,et al. Techniques for sputtering single and multilayer films of uniform resistivity , 1963 .
[39] J. Davies,et al. THE EFFECT OF ENERGY AND INTEGRATED FLUX ON THE RETENTION AND RANGE OF INERT GAS IONS INJECTED AT KEV ENERGIES IN METALS , 1963 .
[40] Y. Matsuda,et al. Energy Dependence of Angular Distributions of Sputtered Particles by Ion-Beam Bombardment at Normal Incidence , 1986 .
[41] J. Vossen,et al. Thin Film Processes , 1979 .
[42] David P. Smith. Analysis of surface composition with low-energy backscattered ions , 1971 .
[43] A. K. Sinha,et al. Control of Resistivity, Microstructure, and Stress in Electron Beam Evaporated Tungsten Films , 1973 .
[44] J. Coburn,et al. Positive‐ion bombardment of substrates in rf diode glow discharge sputtering , 1972 .
[45] D. S. Yee,et al. Modification of niobium film stress by low‐energy ion bombardment during deposition , 1982 .
[46] J. Coburn,et al. Frequency dependence of ion bombardment of grounded surfaces in rf argon glow discharges in a planar system , 1985 .
[47] P. K. Gallagher,et al. Argon Entrapment and Evolution in Sputtered TaSi2 Films , 1985 .
[48] T. Motohiro,et al. Applications of Monte Carlo simulation in the analysis of a sputter‐deposition process , 1986 .
[49] C. M. Wayman,et al. Temperature Changes in Thin Films during Growth by Physical Vapor Deposition. II. Experimental , 1971 .
[50] A. Gras-marti,et al. Evolution towards thermalization, and diffusion, of sputtered particle fluxes: Spatial profiles , 1984 .
[51] T. T. Sheng,et al. Microstructure, growth, resistivity, and stresses in thin tungsten films deposited by rf sputtering , 1973 .
[52] S. Dahlgren. 5 - Materials Production by High Rate Sputter Deposition , 1980 .
[53] Heinz H. Busta,et al. PLASMA ETCH MONITORING WITH LASER INTERFEROMETRY , 1979 .
[54] G. D. Davis,et al. Effects of impurities on the reaction of Ta and Si multilayers processed by rapid thermal annealing , 1986 .
[55] W. Westwood,et al. Tantalum thin films , 1975 .
[56] C. Miner,et al. High rate deposition of transparent conducting films by modified reactive planar magnetron sputtering of Cd2Sn alloy , 1981 .
[57] W. Westwood,et al. Reactive deposition of low loss Al2O3 optical waveguides by modified dc planar magnetron sputtering , 1984 .
[58] W. Westwood. Porosity in sputtered platinum films , 1974 .
[59] I. Blech,et al. Optimization of Al step coverage through computer simulation and scanning electron microscopy , 1978 .
[60] T. Tisone,et al. Low-voltage triode sputtering and backsputtering with a confined plasma: Part IV. Heat transfer characteristics , 1974 .
[61] S. Maniv,et al. Surface oxidation kinetics of sputtering targets , 1980 .
[62] W. Westwood,et al. Reactively sputtered AlN films for GaAs annealing caps , 1986 .
[63] Roger Kelly,et al. Criteria for bombardment-induced structural changes in non-metallic solids , 1975 .
[64] B. Chapman,et al. Glow Discharge Processes: Sputtering and Plasma Etching , 1980 .
[65] S. Maniv,et al. Discharge characteristics for magnetron sputtering of Al in Ar and Ar/O2 mixtures , 1980 .
[66] W. Westwood,et al. Stress control in reactively sputtered AlN and TiN films , 1987 .
[67] J. J. Cuomo,et al. Influence of sputtering parameters on the composition of multicomponent films , 1975 .
[68] Richard W. Wilson,et al. Application of high‐rate E×B or magnetron sputtering in the metallization of semiconductor devices , 1976 .
[69] L. Hartsough. Resistivity of bias-sputtered TiW films , 1979 .
[70] W. Westwood,et al. Investigation of the Sputtering of Aluminum Using Atomic‐Absorption Spectroscopy , 1970 .
[71] Bogdan M. Wilamowski,et al. Temperature properties of the static induction transistor , 1981 .
[72] J. Greene,et al. Diffusion enhancement due to low‐energy ion bombardment during sputter etching and deposition , 1980 .
[73] S. Maniv,et al. The current‐voltage characteristic of magnetron sputtering systems , 1983 .
[74] A. Ricard,et al. Analysis of a reactive sputter ion plating discharge for TiN deposition using optical emission spectroscopy , 1985 .
[75] Michael Hatzakis,et al. Single-Step Optical Lift-Off Process , 1980, IBM J. Res. Dev..
[76] E. L. King,et al. Self‐Induced Sputtering during Electron‐Beam Evaporation of Ta , 1971 .
[77] T. Motohiro,et al. Monte Carlo simulation of the particle transport process in sputter deposition , 1984 .
[78] J. L. Lamb,et al. Substrate heating rates for planar and cylindrical-post magnetron sputtering sources , 1984 .
[79] D. W. Hoffman,et al. The influence of discharge current on the intrinsic stress in Mo films deposited using cylindrical and planar magnetron sputtering sources , 1985 .
[80] S. Schiller,et al. On the use of ring gap discharges for high-rate vacuum coating , 1977 .
[81] W. Bleakney. Ionization Potentials and Probabilities for the Formation of Multiply Charged Ions in Helium, Neon and Argon , 1930 .
[82] R. Glang,et al. Handbook of Thin Film Technology , 1970 .
[83] John A. Thornton,et al. Influence of apparatus geometry and deposition conditions on the structure and topography of thick sputtered coatings , 1974 .
[84] A. K. Suri,et al. Synthesis of titanium nitrides by activated reactive evaporation , 1980 .
[85] J. Bindell,et al. Step coverage from an extended sputtering source , 1974 .
[86] Y. Igasaki,et al. Structure and Electrical Properties of Titanium Nitride Films , 1978 .
[87] J. Coburn,et al. A Study of the Neutral Species rf Sputtered from Oxide Targets , 1974 .
[88] D. W. Hoffman,et al. Modification of evaporated chromium by concurrent ion bombardment , 1980 .
[89] D. King,et al. Oxygen adsorption, reconstruction, and thin oxide film formation on clean metal surfaces - Ni, Fe, W and Mo , 1970 .
[90] C. Aita,et al. Postdeposition annealing behavior of rf sputtered ZnO films , 1980 .
[91] D. W. Pashley. The nucleation, growth, structure and epitaxy of thin surface films , 1965 .
[92] D. W. Hoffman,et al. Internal stresses in sputtered chromium , 1977 .
[93] S. S. Lau,et al. Temperature Rise during Film Deposition by rf and dc Sputtering , 1972 .
[94] A. Mumtaz,et al. Radio frequency magnetron sputtering of radio frequency biased quartz on a scanning pallet , 1984 .
[95] R. R. Parsons,et al. Voltage controlled, reactive planar magnetron sputtering of AlN thin films , 1982 .
[96] T. Serikawa,et al. Reactive sputtering characteristics of silicon in an ArN2 mixture , 1986 .
[97] N. G. Nakhodkin,et al. Effect of vapour incidence angles on profile and properties of condensed films , 1972 .
[98] W. Westwood,et al. Analysis of sputtering discharge by optical and mass spectrometry. I. Platinum and tantalum sputtered in argon , 1973 .
[99] E. Ritter. Deposition of Oxide Films by Reactive Evaporation , 1966 .
[100] R. Holm,et al. ESCA studies on changes in surface composition under ion bombardment , 1977 .
[101] F. Shepherd,et al. Characteristics of dc magnetron, reactively sputtered TiNx films for diffusion barriers in III–V semiconductor metallization , 1984 .
[102] S. Ingrey,et al. Effect of pressure on the properties of reactively sputtered Ta2O5 , 1974 .
[103] Russell Messier,et al. Revised structure zone model for thin film physical structure , 1984 .
[104] H. Kaufman,et al. Langmuir probe characterization of magnetron operation , 1986 .
[105] James F. Smith,et al. Influences of D.C. bias on aluminum films prepared with a high rate magnetron sputtering cathode , 1985 .
[106] A. G. Blachman. Stress and resistivity control in sputtered molybdenum films and comparison with sputtered gold , 1971 .
[107] D. E. Harrison. Sputtering models—A synoptic view , 1983 .
[108] W. D. Westwood,et al. Calculation of deposition rates in diode sputtering systems , 1978 .
[109] H. F. Winters,et al. The chemisorption of nitrogen at activated sites on a polycrystalline tungsten surface , 1971 .