论文信息 - A load-pull wafer-mapper

A load-pull wafer-mapper

This paper describes an automated load-pull measurement testbench for the characterization of GaN power HEMTs. The setup was built around a vector network analyzer (VNA) and an electromechanical tuner. The setup is combined with a semi-automatic wafer-stepper, allowing for complete large-signal wafer-mapping. Both calibration and measurement procedure are explained in mathematical detail.

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