Evaluation of built-in test
暂无分享,去创建一个
[1] Michael Pecht,et al. An investigation of ‘cannot duplicate’ failures , 1998 .
[2] L. J. Popyack,et al. Maintenance processor/time stress measurement device (MP/TSMD) use for failure trend analysis , 1992, Annual Reliability and Maintainability Symposium 1992 Proceedings.
[3] Wayne Moore,et al. Applications of built-in-test equipment within large systems , 1986 .
[4] T. H. Williams,et al. Built-in test and the oceanographic sensor , 1994, Proceedings of OCEANS'94.
[5] V. Ramappan,et al. Are components still the major problem: a review of electronic system and device field failure returns , 1992 .
[6] M. Pecht,et al. Material failure mechanisms and damage models , 1991 .
[7] F. J. Moreno. BITE availability under operational constraints , 1989, Proceedings., Annual Reliability and Maintainability Symposium.
[8] D. Rosenthal,et al. Predicting and eliminating built-in test false alarms , 1990 .
[9] David M. Johnson,et al. A review of fault management techniques used in safety-critical avionic systems , 1996 .
[10] L. Y. Ungar. Built-in test IC provides automatic test equipment capabilities , 1991, Conference Record AUTOTESTCON '91 IEEE Systems Readiness Technology Conference Improving Systems Effectiveness in the Changing Environment of the '90s.