论文信息 - TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses - 字舞流文

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CMOS Transistors Irradiated to Ultrahigh Doses

peixiong zhao | R. Reed | E. Zhang | D. Linten | A. Paccagnella | D. Fleetwood | J. Mitard | S. Mattiazzo | S. Bonaldo | S. Gerardin | M. Bagatin | Teng Ma | M. Gorchichko