论文信息 - Temperature impact (up to 200 °C) on performance and reliability of HfO2-based RRAMs - 字舞流文

Temperature impact (up to 200 °C) on performance and reliability of HfO2-based RRAMs

G. Molas | E. Vianello | J. Nodin | A. Toffoli | H. Grampeix | T. Cabout | L. Perniola | B. De Salvo | O. Pirrotta | L. Larcher | A. Padovani | C. Muller | G. Reimbold | M. Guillermet | P. Candelier | M. Bocquet | E. Jalaguier | V. Jousseaume | T. Diokh